A Weibull-Based Statistical Lifetime Assessment Of SiC MOSFETs Under Multivariable Short-Circuit Stress
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Autores:
K. Kovács, M. Minárok. J. Kozárik, J. Marek
Publicado en:
14th International Conference on Advances in Electronic and Photonic Technologies - ADEPT 2026, 2026
Editor:
University of Zilina in EDIS-Publishing Centre of UNIZA
DOI:
10.5281/ZENODO.21452831
Statistical Analysis of Short-Circuit Endurance in SiC MOSFETs under Voltage and Temperature Variations
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Autores:
KOVÁCS, Krisztián - MINÁRIK, Michal - KOZÁRIK, Jozef - MAREK, Juraj
Publicado en:
Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe (WOSCDICE EXMATEC 2026)., 2026
Editor:
Polish Academy of Sciences
DOI:
10.5281/ZENODO.21452611
Toward Lifetime Prediction Under Variable Load Conditions in Power Electronics: Evaluation of Damage Accumulation Rules for Solder System Attach
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Autores:
Tobias Daniel Horn, Jan Albrecht, Anu Mathew, Rico Eichhorn, Sven Rzepka
Publicado en:
2025 IEEE 27th Electronics Packaging Technology Conference (EPTC), 2026, ISBN 979-8-3315-6145-1
Editor:
IEEE
DOI:
10.1109/EPTC67330.2025.11392357