A Weibull-Based Statistical Lifetime Assessment Of SiC MOSFETs Under Multivariable Short-Circuit Stress
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Author(s):
K. Kovács, M. Minárok. J. Kozárik, J. Marek
Published in:
14th International Conference on Advances in Electronic and Photonic Technologies - ADEPT 2026, 2026
Publisher:
University of Zilina in EDIS-Publishing Centre of UNIZA
DOI:
10.5281/ZENODO.21452831
Statistical Analysis of Short-Circuit Endurance in SiC MOSFETs under Voltage and Temperature Variations
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Author(s):
KOVÁCS, Krisztián - MINÁRIK, Michal - KOZÁRIK, Jozef - MAREK, Juraj
Published in:
Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe (WOSCDICE EXMATEC 2026)., 2026
Publisher:
Polish Academy of Sciences
DOI:
10.5281/ZENODO.21452611
Toward Lifetime Prediction Under Variable Load Conditions in Power Electronics: Evaluation of Damage Accumulation Rules for Solder System Attach
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Author(s):
Tobias Daniel Horn, Jan Albrecht, Anu Mathew, Rico Eichhorn, Sven Rzepka
Published in:
2025 IEEE 27th Electronics Packaging Technology Conference (EPTC), 2026, ISBN 979-8-3315-6145-1
Publisher:
IEEE
DOI:
10.1109/EPTC67330.2025.11392357